SilentRIM Lens Material Test System
The material test system based on SilentRIMTM Lens technologies is used to evaluate the transmission characteristics of materials, enabling the calculation of intrinsic properties such as dielectric permittivity, magnetic permeability, sheet impedance, resistivity and conductivity.
Features
- Cover from 0.85GHz to mmWave frequency range up to 50GHz
- Loss tangent measurement accuracy down to 0.001 level
- Automatic scan and control setup
- Paired with software for automatically calibration and calculation of the material properties (dialectic constant and loss tangent)
Typical Applications
- RF material and component design: Radomes, absorbers, PCB substrate for microwave applications.
- Performance characterization: Measuring insertion loss of radomes and reflection loss of radar absorbers.
- Shielding effectiveness: assessing conductive materials by measuring the conductivity or isolation by the material.